DTG5000 시리즈는 데이터 발생기의 성능과 펄스 발생기의 기능을 결합하여 복잡한 테스트 절차 구축 시간을 줄이고 여러 채널에 걸친 저지터 고정밀 클럭 및 직렬 데이터 신호의 생성을 간소화합니다.
Features & Benefits
- Versatile Platform Combines Features of Data Generator, Pulse Generator, and DC Source
- Up to 3.35 Gb/s Data Rate
- From 1 to 96 Data Channels (Master/Slave)
- Class Leading Delay Resolution of 0.2 ps (DTG5274/DTG5334), 1 ps(DTG5078), up to 600 ns of Total Delay
- Modular Architecture Helps to Protect Your Investment and Allows the Instrument to Expand With Your Growing Needs
- Advanced Control Over Signal Parameters to Meet Most Current Testing Needs, Including Stressed Eye Generation
- Easy to Use and Learn, Shortens Time to Test
- Up to 64 Mb Pattern Depth Per Channel for Complex Data Patterns
Applications
- Semiconductor Device Functional Test and Characterization
- Support for Semiconductor Technologies from TTL to LVDS
- Initial Verification and Debugging, Comprehensive Characterization, Manufacturing, and Quality Control
- Compliance and Interoperability Testing to Emerging Standards
- PCI-Express Gen1:2.5 Gbps
- Serial ATA Gen1/2:1.5 Gbps/3 Gbps
- InfiniBand 2.5 Gbps
- XAUI: 3.125 Gbps
- HDMI: Version 1.3 / DVI
- Magnetic and Optical Storage Design
- Research, Development, and Test of Next-generation Devices (HDD, DC/DVD, Blu-ray)
- Data Conversion Device Design
- Characterization and Test of Next-generation D/A Convertors
- Imaging Sensor Device Design
- Characterization and Functional Testing of Next-generation Imaging Devices (CCD/CMOS)
- Jitter Transfer and Jitter Tolerance Testing
